Microelectromechanical system pressure sensor and method for making and using

ABSTRACT

According to some embodiments, a conducting layer is formed on a first wafer. An insulating layer is formed on a second wafer. The insulating layer includes a cavity and a conducting area may be formed in the second wafer proximate to the cavity. The side of the conducting layer opposite the first wafer is bonded to the side of the insulating layer opposite the second wafer. At least some of the first wafer is then removed, without removing at least some of the conducting layer, to form a conducting diaphragm that is substantially parallel to the second wafer. In this way, an amount of capacitance between the diaphragm and the conducting area may be measured to determine an amount of pressure being applied to the diaphragm.

BACKGROUND

A pressure sensor may convert an amount of pressure into an electricalvalue. For example, a pressure sensor may include a diaphragm ormembrane positioned over a well formed in a substrate. When thediaphragm and the bottom of the well are conductors and are electricallyisolated from each other, an amount of pressure being applied to thediaphragm may be converted into a capacitance value. Creating such asensor, however, can be a complex process (e.g., bulk micromachiningmight be used to form the well in a ceramic or glass substrate).Moreover, even small variations in the dimensions of the diaphragm orthe well can reduce the accuracy and/or sensitivity of the sensor. Inaddition, parasitics associated with the sensing region may furtherdegrade the sensor's performance.

SUMMARY

According to some embodiments, a conducting layer may be formed on afirst wafer. An insulating layer may be formed on a second wafer, andthe insulating layer may include a cavity. The side of the conductinglayer opposite the first wafer may then be bonded to the side of theinsulating layer opposite the second wafer. At least a portion of thefirst wafer may then be removed, without removing at least a portion ofthe conducting layer associated with the cavity, to form a diaphragmsubstantially parallel to the second wafer.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a side view of a pressure sensor in accordance with anexemplary embodiment of the invention.

FIG. 2 is a perspective view of the pressure sensor of FIG. 1.

FIG. 3 is a side view of the pressure sensor of FIG. 1 when exposed to apressure.

FIG. 4 illustrates a method to create a pressure sensor according tosome embodiments.

FIGS. 5 through 10 are side views illustrating the construction of apressure sensor in accordance with an exemplary embodiment of theinvention.

FIGS. 11 through 19 are side views illustrating the construction of apressure sensor in accordance with another exemplary embodiment of theinvention.

FIG. 20 is a top view of a pressure sensor in accordance with anexemplary embodiment of the invention.

FIG. 21 illustrates a method to measure pressure according to someembodiments.

FIG. 22 is a system constructed in accordance with another exemplaryembodiment of the invention.

DETAILED DESCRIPTION

FIG. 1 is a side view of a pressure sensor 100 in accordance with anexemplary embodiment of the invention. The sensor 100 may be, forexample, a Microelectromechanical System (MEMS) device formed using awafer 130, such as a wafer 130 of lightly doped silicon. The top surfaceof the wafer 130 may be a substantially flat surface that defines aplane, and an insulating layer 150 may be formed on that surface of thewafer 130. The insulating layer 150 may be, for example, a layer ofoxide grown or deposited on the wafer 130. The insulating layer 150includes a cavity C.

A conducting portion 140 may be formed in or on the wafer 130 in thearea beneath the cavity C. The conducting portion 140 may be, forexample, an area of highly doped silicon. The area of the conductingportion 140 may be smaller than, larger than, or equal to the area ofthe cavity C.

A conducting diaphragm 110 may be bonded to the insulating layer 150over the cavity C. For example, the conducting diaphragm 110 may a thin,flexible membrane that covers the cavity C and that is substantiallyparallel to the plane defined by the surface of the wafer 130.

FIG. 2 is a perspective view of the pressure sensor 100 of FIG. 1. Inparticular, the conducting diaphragm 110 is attached to the insulatinglayer 150, which in turn is attached to the wafer 130 to form the cavityC (not illustrated in FIG. 2). In this way, the conducting diaphragm 110may be electrically isolated from the conducting portion 140 of thewafer 130 located below the cavity C. Although a rectangular conductingdiaphragm 110, insulating layer 150, and wafer 130 are illustrated inFIG. 2, these elements may have any other type of shape (e.g., theconducting diaphragm 110 and insulating layer 150 may form a disc-shapedcavity).

Note that the conducting diaphragm 110 may be deformable in a directionsubstantially normal to the plane defined by the surface of the wafer130. For example, as illustrated in FIG. 3 the conducting diaphragm 110may flex toward the conducting portion 140 in response to a pressure(P). That is, the distance between at least a portion of the conductingdiaphragm 110 and the conducting portion 140 may decrease when thepressure P increases. Note that the conducting diaphragm 110 may includea non-conducting portions. For example, the conducting diaphragm 110might be formed using an insulating material with a layer of metaldeposited on top.

Note that a capacitance between the conducting diaphragm 110 and theconducting portion 140 depends in part on the distance between them. Inparticular, because the conducting diaphragm 110 and the conductingportion 140 are electrically isolated from each other, the capacitancebetween them will increase as they move closer to each other. Anincrease in the pressure P, therefore, can be measured based on theincreased capacitance, since the increased pressure P will push at leasta portion of the conducting diaphragm 110 closer to the conductingportion 140.

According to some embodiments, a voltage level (e.g., a ground voltageor a voltage V) may be associated with at least one of the conductingportion 140 and the conducting diaphragm 110. For example, a pressurevoltage contact may be connected to the conducting diaphragm 110 and aground voltage contact may be connected to the conducting portion 140.Moreover, the pressure P may be measured based at least in part on thecapacitance between the conducting portion 140 and the conductingdiaphragm 110 (e.g., an increase in the pressure P may be associatedwith an increase in capacitance).

FIG. 4 illustrates a method to create a pressure sensor according tosome embodiments. At Step 402, a conducting layer is formed on a firstwafer. For example, FIG. 5 illustrates a first portion 500 of a pressuresensor that includes a conducting layer 510 formed on a first wafer 520.The first wafer 520 might comprise, for example, a lightly doped siliconwafer. The conducting layer 510 might be formed, for example, byepitaxially growing a highly doped layer on the first wafer 520.According to some embodiments, the surface of the highly doped layer 510opposite the first wafer 520 is substantially smooth. FIG. 5 alsoillustrates another embodiment of a first portion 502 which utilizes ahighly doped silicon layer of a Silicon On Insulator (SOI) wafer. Inparticular, this embodiment the first portion 502 may include a thinlayer of silicon 512 on a layer of oxide 532, which in turn is bonded toa silicon substrate 542.

Referring again to FIG. 4, an insulating layer is formed on a secondwafer at Step 404. For example, FIG. 6 illustrates a second portion 600of a pressure sensor that includes an insulating layer 650 formed on asecond wafer 630.

The second wafer 630 may be, for example, a silicon wafer or an SOIwafer. Moreover, a conducting area 640 may have been provided in or onthe second wafer 630 (e.g., the conducting area 640 might be implantedbefore the insulating layer 650 was added). When the second wafer 630 isa lightly doped silicon wafer, for example, the conducting area 640might be a highly doped area created by a suitable mechanism or process,such as, for example, via diffusion or ion bombardment. The second wafer630 may, according to some embodiments, be a highly doped, conductingsilicon wafer.

The insulating layer 650 may be, for example, a layer of oxide that hasbeen deposited or grown on the second wafer 630. According to someembodiments, the surface of the oxide layer 650 opposite the secondwafer 630 is substantially smooth.

According to some embodiments, a cavity is then created in theinsulating layer in an area proximate to the conducting area 640. Forexample, a pattern mask and a potassium hydroxide wash may be used toform a cavity C as illustrated in FIG. 7. Note that the size of thecavity C might be smaller, larger, or equal to the size of theconducting area 640.

Referring again to FIG. 4, the first portion 500 and the second portion600 of the sensor may be bonded together at Step 406. In particular, asillustrated in FIG. 8, the surface of the conducting layer 510 oppositethe first wafer 520 may be bonded to the surface of the insulating layer650 opposite the second wafer 630.

The combined first portion 500 and second portion 600 can then be usedto create a pressure sensor 900 as illustrated in FIG. 9. Referringagain to FIG. 4, at Step 408 at least a portion of the first wafer 520is then removed (without removing at least a portion of the conductinglayer 510 associated with the cavity C) to form a diaphragmsubstantially parallel to the second wafer 630.

FIG. 10 illustrates the pressure sensor 900 after the first wafer 520has been completely removed. The sensor 900 may function as a MEMScapacitive pressure sensor because the conducting layer 510 will flextoward the conducting area 640 in response to an external pressure. Anincrease in pressure, therefore, can be measured based on an increase incapacitance between the conducting layer 510 and the conducting area640.

FIGS. 11 through 19 are side views illustrating the construction of apressure sensor in accordance with another exemplary embodiment of theinvention. A first portion 1100 of the sensor includes a conductinglayer 1110 formed on a first wafer 1120 as illustrated in FIG. 11. Thefirst wafer 1120 is an n-Si wafer and the conducting layer 1110 is ahighly doped layer of p++ Si. The conducting layer 1110 may be, forexample, approximately 3 μm thick. Moreover, the conducting layer 1110may be doped with Boron or Boron/Germanium and may have been epitaxiallygrown on the first wafer 1120. According to some embodiments, the firstportion 1100 instead comprises a SOI wafer. Note that steps may be takento ensure that the surface of the conducting layer 1110 opposite thefirst wafer 1120 is substantially smooth and flat (e.g., to facilitatebonding).

As illustrated in FIG. 12, a second portion 1200 may include a secondwafer 1230, such as a standard, n-type lightly doped silicon wafer or anintrinsic wafer. Moreover, a conducting area 1240 is provided in or onthe second wafer 1230. The conducting area 1240 may comprise, forexample, a p+ or p++ highly doped implant formed using diffusion and/orion bombardment. Note that as various layers are added to, and removedfrom, the second portion 1200, steps may be taken to ensure that the topsurface of the second portion 1200 remains substantially smooth and flat(e.g., to facilitate bonding with the first portion 1100). For example,it may be difficult to bond the first portion 1100 to the second portion1200 if the second portion 1200 has become substantially warped.

According to some embodiments, a bias area 1242 is also provided in oron the second wafer 1230. The bias area 1242 may include, for example,an n+ portion that will be used to positively bias the substrate of thesecond wafer 1230 (e.g., with a potential equal to that which will beapplied to a conducting diaphragm). As a result, parasitic capacitanceassociated with the sensor may be reduced.

As illustrated in FIG. 13, an insulating layer 1250 is formed on thesurface of the second wafer 1230. According to some embodiments, a layerof oxide approximately 3 μm thick may be grown or deposited on thesecond wafer 1230. By growing the insulating layer 1250 on the secondwafer 1230, the thickness of the cavity that is eventually produced canbe tightly controlled (e.g., as compared to a well that is created usingbulk micromachining).

A photo-resist pattern may be used to remove portions of the insulatinglayer 1250. In particular, a cavity C may be created proximate to theconducting area 1240 of the second wafer 1230 (FIG. 14). In addition, aportion of the insulating layer 1250 may be removed to expose the biasarea 1242 of the second wafer 1230. According to some embodiments, otherportions of the insulating layer 1250 are removed to create a referencecavity REF C and to expose the conducting area 2140 of the second wafer1230 (e.g., so that a ground voltage can be provided to the conductingarea 2140). According to other embodiments, the insulating layer 1250 isnot removed from the reference cavity REF C (in which case the oxidewill act as the dielectric for the reference sensor instead of air or avacuum).

A non-conducting protective layer 1252 may then be provided on theinsulating layer 1250 as illustrated in FIG. 15. The protective layer1252 may be, for example, a 150 nanometer (nm) layer of oxide that isgrown or deposited on the second portion 1200. According to someembodiments, the protective layer 1252 may prevent a conductingdiaphragm over the cavity C from directly contacting the conducting area1240 in the second wafer 130 in the event of an overpressure. As will beexplained, the protective layer 1252 may also prevent portions of theconducting area 1240 from being inadvertently removed (e.g., as thesensor is being created).

As illustrated in FIG. 16, the conducting layer 1110 of the firstportion 1100 may then be bonded to the protective layer 1252 of thesecond portion 1200 to create a pressure sensor 1600. Note thatnon-aligned bonding techniques may be used to attach the two portions1100, 1200.

According to some embodiments, a vacuum is created in the cavity C. Forexample, the portions 1100, 1200 may be bonded at a low temperature andthe temperature may then be increased in a vacuum environment to createa vacuum in the cavity C. According to other embodiments, apre-determined pressure is sealed into the cavity C (e.g., to produce agate sensor that determines whether an input pressure exceeds thepre-determined pressure by a threshold amount).

The first wafer 1120 may then be removed. For example, a potassiumhydroxide wash may be used to etch away the first wafer 1120. In thiscase, the p++ Si conducting layer 1110 may automatically stop or slowdown the etching process.

In addition, portions of the conducting layer 1110 may be removed asillustrated in FIG. 17. For example, a mask may be used to pattern theareas to be removed. Note that the protective layer 1252 may prevent theconducting area 1240 and the bias area 1242 from being inadvertentlyremoved.

A short oxide etch may then be performed on the sensor 1600 to removethe protective layer 1242 from certain areas as illustrated in FIG. 18.Note that the conducting diaphragms may prevent the protective layer1252 from being removed inside the cavity C and the reference cavity REFC.

As illustrated in FIG. 19, a metallic deposit and mask may be used tocreate: (i) a pressure electrode contacting the diaphragm over thecavity C, (ii) a reference electrode contacting the diaphragm over thereference cavity REF C, (iii) a ground electrode contacting theconducting areas 1240 under the cavity C and the reference cavity REF C,and (iv) a bias electrode to provide a potential to the substrate of thesecond wafer 1230.

FIG. 20 is a top view of the pressure sensor 1600 in accordance with anexemplary embodiment of the invention. The pressure electrode and theground electrode may be used to determine any change in capacitancebetween the conducting diaphragm 1112 and the conducting area 1240 underthe cavity C. That is, a change in capacitance may be detected and usedto determine a change in pressure to which the conducting diaphragm 1112is being exposed. Note that any technique might be used to measure anamount of and/or a change in capacitance. For example, a change incapacitance might be converted into a voltage that can be measuredand/or approaches using Alternating Current (AC) could be implemented.

The reference electrode and the ground electrode may be used todetermine any change in capacitance between the reference diaphragm 1114and the conducting area 1240 under the reference cavity REF C. Thereference cavity REF C may, for example, be used to help determine whena change in capacitance associated with the conducting diaphragm 1112 isdue to a change in temperature and/humidity as opposed to a change inpressure. Note that the reference cavity REF C may be smaller than,larger than, or the same size as the cavity C. For example, when air isthe dielectric for the cavity C and oxide is the dielectric for thereference cavity REF C, the reference cavity REF C might be smaller thanthe cavity C (e.g., because oxide has a higher dielectric constant thanair).

FIG. 21 illustrates a method to measure pressure according to someembodiments. At Step 2102, a voltage level is provided to at least oneof (i) a conducting portion of a wafer and (ii) a conducting diaphragmin accordance with any of the embodiments described herein. For example,the conducting portion may be associated with a wafer having asubstantially flat surface defining a plane. Moreover, the wafer mayhave an insulating layer on the surface, and the insulating layer mayinclude a cavity proximate to the conducting portion. The conductingdiaphragm may be bonded to the insulating layer to cover the cavity andmay be substantially parallel to the plane defined by the surface of thewafer.

At Step 2104, the capacitance between the conducting portion and theconducting diaphragm is measured. At Step 2106, an amount of pressure isdetermined based on the capacitance measured at Step 2104.

Thus, some embodiments may provide a MEMS sensor that is accurate andinexpensive to produce (e.g., because the thicknesses of the diaphragmsand cavities can be accurately defined and controlled by growing layerson silicon wafers).

The following illustrates various additional embodiments of theinvention. These do not constitute a definition of all possibleembodiments, and those skilled in the art will understand that thepresent invention is applicable to many other embodiments. Further,although the following embodiments are briefly described for clarity,those skilled in the art will understand how to make any changes, ifnecessary, to the above-described apparatus and methods to accommodatethese and other embodiments and applications.

Some embodiments have been described herein with respect to an absolutepressure sensor, but embodiments may be used in connection with a gaugeor differential pressure sensor. For example, a first pressure P1 may beapplied to the outer surface of the conducting diaphragm. Moreover, apassage may be provided into the cavity C through which a secondpressure P2 is introduced. In this case, a change in capacitance wouldbe associated with a difference between the two pressures P1, P2.According to another embodiment, a low doped layer is patterned with aconducting layer on the side opposite the cavity C (e.g., which maylower parasitics).

While embodiments have been described with respect to pressure sensors,note that any of the embodiments may be associated with a system thatuses a pressure sensor. For example, FIG. 22 is a system 2200constructed in accordance with another exemplary embodiment of theinvention. The system 2200 includes a MEMS pressure sensor 2210 thatoperates in accordance with any of the embodiments described herein. Forexample, the MEMS pressure sensor 2210 might include an apparatus suchas the one illustrated in FIGS. 19 and 20.

Information from the MEMS pressure sensor 2210 is provided to a pressuredependent device 2220 (e.g., via an electrical signal). The pressuredependent device 2220 might be, for example, associated with a pressuredisplay, a pressure monitor, an engine or automotive device (e.g., atire pressure monitor), an ultrasonic transducer, a medical device(e.g., a blood pressure sensor), and/or a barometer.

In addition, although some embodiments have been described with respectto the use of a capacitance value to sense an amount of pressure,embodiments might be associated with other types of displacement sensingtechniques. For example, the deformable, conducting diaphragms describedin any of the embodiments described herein may be replaced withdiaphragms that have piezoelectric and/or piezoresistancecharacteristics (or devices having such characteristics may be embeddedinto or onto the diaphragms). According to this embodiment, an amount ofresistance associated with the diaphragm will vary depending on anamount of stress. As a result, the resistance may be measured and usedto determine a corresponding amount of pressure (e.g., an increase inpressure will cause the diaphragm to flex more and thus change theresistance). Note that according to this embodiment, the diaphragm mayor may not be conductive. According to some embodiments, changes in bothcapacitance and resistance are used to determine an amount of pressure.

Further, although particular layouts and manufacturing techniques havebeen described herein, embodiments may be associated with other layoutsand/or manufacturing techniques. For example, cap wafers with pressureand/or electrical ports may be provided for any of the embodimentsdescribed herein. Such wafers may, for example, be used to interfacewith an Application Specific Integrated Circuit (ASIC) device.

Some embodiments described herein have included a conducting portion 140embedded in or on wafer 130. Note. however, that the entire wafer 130might act as the conducting portion (e.g., a highly doped silicon layerfrom a SOI wafer).

The present invention has been described in terms of several embodimentssolely for the purpose of illustration. Persons skilled in the art willrecognize from this description that the invention is not limited to theembodiments described, but may be practiced with modifications andalterations limited only by the spirit and scope of the appended claims.

1-21. (canceled)
 22. A method, comprising: providing a voltage level toat least one of (i) a conducting portion associated with a wafer havinga substantially flat surface defining a plane, the wafer having aninsulating layer on the surface, and the insulating layer having acavity proximate to the conducting portion and (ii) a conductingdiaphragm bonded to the insulating layer, the conducing diaphragmcovering the cavity and being substantially parallel to the plane; andmeasuring pressure based at least in part on capacitance between theconducting portion and the conducting diaphragm. 23-24. (canceled)